Agilent E5061A ENA-L 射頻網絡分析儀，300 kHz 至 1.5 GHz

 租售E5061A,維修E5061A,E5061A回購利用,E5061A深圳市美佳特科技有限公司技術方案支持

主要特性與技術指標

T/R 或 S 參數綜合測試儀

50 或 75 歐姆測試端口阻抗

120 dB 的動態范圍和 0.005 dB rms 的跡線噪聲

內置 Visual Basic® 應用程序設計語言（VBA）

描述

E5061A 通用網絡分析儀采用現代的技術，具有易于使用的特性和穩定的性能，從而能夠進行可靠的基礎 S 參數測量。

Table 1-10 Test port input levels

Description Specification Typical

Maximum test port input level

 300 kHz to 3 GHz +10 dBm

Damage level

 300 kHz to 3 GHz +20 dBm, ±30 VDC

Crosstalk1

 300 kHz to 3 GHz –110 dB

Table 1-11 Test port input (trace noise2)

Description Specification Typical

Trace noise magnitude

 300 kHz to 1 MHz 8 mdB rms (23 °C ±5 °C)

 (source power level = +10 dBm)

 1 MHz to 3 GHz 5 mdB rms (23 °C ±5 °C)

 (source power level = +10 dBm)

Trace noise phase

 300 kHz to 1 MHz 0.05° rms (23 °C ±5 °C)

 (source power level = +10 dBm)

 1 MHz to 3 GHz 0.03° rms (23 °C ±5 °C)

 (source power level = +10 dBm)

Test port input

1. Response calibration not omitted.

2. Trace noise is defined as a ratio measurement of a through, at IF bandwidth = 3 kHz.

3. Stability is defined as a ratio measurement at the test port.

Table 1-12 Test port input (stability 3)

Description Specification Typical

Stability magnitude

3 MHz to 3 GHz 0.01 dB/°C

 (at 23 °C ±5 °C)

Stability phase

3 MHz to 3 GHz 0.1°/°C

 (at 23 °C ±5 °C)